CVE-2025-47318

CVE-2025-47318 is a transient denial-of-service vulnerability in Qualcomm chipsets caused by parsing the EPTM test control message to retrieve the test pattern. The issue affects the EPTM parsing path and is described as a DoS with no confidentiality/integrity loss and high availability impact. P...

CVE-2025-47342

CVE-2025-47342 concerns Qualcomm chipsets where a transient denial-of-service can occur due to concurrency involving QHS and multi-profile configurations. The Red Hat/NVD/CVE records describe the issue as a transient DOS when multiple profiles are used concurrently with QHS enabled; the CVE List ...

CVE-2025-47370

Technical details, affected product/versions, root cause, and fixes for CVE-2025-47370 are not publicly provided in the supplied documents. Monitor for updates from vendors/security bulletins.

CVE-2025-47317

CVE-2025-47317 is described in the provided sources as memory corruption due to a global buffer overflow when a test command uses an invalid payload type. Connected documents identify Qualcomm-related components and reference a Qualcomm security bulletin; the exact affected product/version detail...